Is it possible to measure solid samples by reflection?

Yes, all our spectrometers, as well as the Microscope extension for Helios, have the reflection option.

BACK TO KNOWLEDGE BASE
We continuously improve our products and reserve the right to change products and specifications
at any time without notice. Images may or may not include optional equipment.

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

© 2002 – 2024 Ultrafast Systems, 8330 Consumer Ct, Sarasota, FL 34240, USA. All Rights Reserved.

sales@ultrafast.systems
+1 941 360 2161

Before contacting our support team we encourage you to check out our knowledge base

An answer to your question might already be there.

Send a message
to our sales team